SCHAUMBURG, IL – K ALPHA has acquired Bowman Analytics, its long-time partner for X-ray fluorescence (XRF) instrumentation for coating thickness measurement, elemental analysis, and solution analysis. Business operations between the two companies will merge and there will be one unified management team leading the combined offering. Bowman Analytics will maintain its facility in Pompano Beach, FL.
Key members of both Bowman Analytics and K ALPHA have worked together before, when they were at Coating Measurement Instruments.