Johannes Meyer Receives EMVA Young Professional Award 2019
COPENHAGEN, Denmark — Dr. Johannes Meyer has received the EMVA Young Professional Award 2019 for his work “Light Field Methods for the Visual Inspection of Transparent Objects.” Meyer has been working as a Research Scientist in close cooperation between the Vision and Fusion Laboratory of the KIT and the Visual Inspection Systems department of the Fraunhofer-Institute of Optronics, System Technologies and Image Exploitation IOSB in Germany. In 2018, he obtained a PhD in computer science from the KIT. Since 2019, he has been working for ITK Engineering GmbH in the field of computer vision.
Objects made from transparent materials play crucial roles in humans’ everyday life. They are employed, for example, as windshields, glasses or as plastic lenses to guide laser beams in eye surgery. Especially when considering the latter example, it is obvious that such objects must meet high quality requirements. Hence, a visual inspection for material defects, like enclosed air bubbles or surface scratches, is inevitable. Human visual inspection is a fatiguing task, which is not very robust and prone to subjective results or even to unrevealed defects. Automated visual inspection systems represent a reliable alternative to manual inspection. However, the automated inspection of complex-shaped transparent objects like lenses and windshields still represents a challenging task with several open research questions.