The F20-UVX thin-film measurement system from Filmetrics uses an expanded wavelength range of 200 to 1700 nm for increased thin-film analysis capabilities. This new system can measure the thickness of films from 30Å to 450 µm thick and optical constants of films from 500Å to 10 µm thick.

The F20-UVX thin-film measurement system from Filmetrics uses an expanded wavelength range of 200 to 1700 nm for increased thin-film analysis capabilities. This new system can measure the thickness of films from 30Å to 450 µm thick and optical constants of films from 500Å to 10 µm thick. It can be used to measure any smooth, optically transparent film. The system determines thickness by illuminating the sample with white light and measuring the reflectance spectrum off the film. Once the spectrum is collected, the system’s software analyzes it to determine thickness, optical constants, and other user-selectable parameters.

Related accessories allow for the measurement of round, cylindrical, or freestanding films, as well as flat samples. Applications include photoresist and other semiconductor-specific films, dielectric films, polymers, and ophthalmic coatings.

For more information, call 858.573.9300 or visit www.filmetrics.com.