This article focuses on the use of Block Engineering’s LaserScan™ analyzer (Figure 1) as a handheld spectrometer, based on quantum cascade laser (QCL) technology, for detecting and quantifying silicone film thicknesses.
Infrared spectroscopy is a well-established technique for detecting and identifying contaminants on surfaces, in particular metallic surfaces. Detection levels can be as low as fractions of a microgram, depending on factors such as viewing/measurement angles and use of a polarized infrared beam. Detection of silicone films is an important application. For example, silicone release coatings are applied to surfaces to facilitate the manufacture of carbon-fiber/epoxy laminating materials.