MoreThe F20-UVX is a new thin-film measurement system with an expanded wavelength range of 200 nm to 1700 nm for increased thin-film analysis capabilities.
Filmetrics: The F20-UVX is a new thin-film measurement system with an expanded wavelength range of 200 nm to 1700 nm for increased thin-film analysis capabilities. This system can measure the thickness of films from 30Å to 450µm thick and optical constants of films from 500Å to 10µm thick. This affordable system is a recognized alternative to high-priced ellipsometry and stylus-based systems.
E-mail chalmers@filmetrics.com.
With access to over one million professionals and more than 60 industry-specific publications,
