True Surface Microscopy Wins Innovation Award
October 1, 2011
ULM, Germany – WITec has received the Microscopy Today Innovation Award for the development of True Surface Microscopy. Each year, Microscopy Today magazine selects the best new development in microscopy and presents the award at the U.S. Microscopy and Microanalysis Exhibition and Conference, which took place this year in Nashville, TN. True Surface Microscopy allows confocal Raman imaging guided by surface topography. The topographic coordinates measured from an integrated profilometer are used to perfectly follow the sample surface in confocal Raman imaging mode. The result is an image revealing optical or chemical properties at the surface of the sample, even if this surface is very rough or heavily inclined.