HOPEWELL JUNCTION, NY - A call for papers has been issued for the 12th International Symposium on Particles on Surfaces: Detection, Adhesion, and Removal. The conference will be held in conjunction with the Process Cleaning Expo in Louisville, KY, on May 4-6, 2010.
MST Conferences, the sponsor of the event, is currently accepting abstracts for papers on the following topics: detection, identification and characterization of particles on surfaces in micrometer scale and nanometer scale; factors that influence particle adhesion including chemistry, topography, shape, size, relative humidity and medium; particle adhesion measurement techniques and forces affecting adhesion; techniques for particle removal including the challenge of nano-scale removal and the role of fluid dynamics in particle removal; implications of particle contamination in microelectronic applications, biomedical applications, optical applications and precision-tool applications; thermodynamics of particle removal, including interactions with fluids, electrolytes and solvents; and detection and removal of bacteria and viruses considered as particles.
For more information about paper submissions, contact Robert H. Lacombe, Symposium Chairman, at 845/897.1654 or e-mail rhl@mstconf.com.