Topographic Confocal Raman Imaging - The Next Evolutionary Leap in Cutting-Edge Microscope Configurations
WITec, a leader in
nano-analytical microscopy systems, has launched the new True Surface
Microscopy option. The core element of this revolutionary imaging mode is an
integrated sensor for optical profilometry. Large-area topographic coordinates
from the profilometer measurement can be precisely correlated with the
large-area confocal Raman imaging data. This allows for the first time confocal
Raman imaging along heavily inclined or very rough samples with the true
surface held in constant focus while maintaining the highest confocality. With
the new imaging mode, samples that had previously required extensive
preparation in order to obtain a certain surface flatness can now be
effortlessly and automatically characterized as they are. Complete system
control, as well as extensive data evaluation, are integrated within the WITec
Control and WITec Project software environment, guaranteeing renowned
ease-of-use.
“The integrated combination of optical profilometry and large-area confocal Raman imaging is the next evolutionary leap in cutting-edge microscope configurations.” says Dr. Olaf Hollricher, WITec Managing Director R&D. “Only an inherently modular instrument design can enable such a seamless incorporation of a groundbreaking and complementary imaging technique into the present product line of Raman-AFM systems.”
The profilometry capabilities of True Surface Imaging mode allows scan ranges of up to 50 x 100 mm with a spatial resolution on the order of 100 nm vertically and 10 µm laterally. Measuring distances of 10 mm and more provide flexibility for variable sample size requirements. In combination with AFM, the profilometer can even be used as a pre-inspection tool to determine topographic features of interest for high-resolution AFM investigations on large samples. The overall performance and exceptionally accurate imaging capabilities of True Surface Microscopy are beneficial for many applications, including the characterization of micromechanical, medical or semiconductor devices, the mapping of functionalized surfaces, or the imaging of bio-medical or pharmaceutical material surface properties.
For more information, visit www.witec.de.
“The integrated combination of optical profilometry and large-area confocal Raman imaging is the next evolutionary leap in cutting-edge microscope configurations.” says Dr. Olaf Hollricher, WITec Managing Director R&D. “Only an inherently modular instrument design can enable such a seamless incorporation of a groundbreaking and complementary imaging technique into the present product line of Raman-AFM systems.”
The profilometry capabilities of True Surface Imaging mode allows scan ranges of up to 50 x 100 mm with a spatial resolution on the order of 100 nm vertically and 10 µm laterally. Measuring distances of 10 mm and more provide flexibility for variable sample size requirements. In combination with AFM, the profilometer can even be used as a pre-inspection tool to determine topographic features of interest for high-resolution AFM investigations on large samples. The overall performance and exceptionally accurate imaging capabilities of True Surface Microscopy are beneficial for many applications, including the characterization of micromechanical, medical or semiconductor devices, the mapping of functionalized surfaces, or the imaging of bio-medical or pharmaceutical material surface properties.
For more information, visit www.witec.de.
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