JEOL The JSM-7800F represents a significant leap forward in field emission SEM technology, with resolution and stability for nanotechnology imaging and analysis. The JSM-7800F allows users to: observe nanomaterials at 1,000,000X magnification with sub-1nm resolution, perform low kV imaging and analysis of highly magnetic samples, collect large-area EBSD maps at low magnifications without distortion, and image electron-transparent samples with sub 0.8 nm resolution. It is suitable for applications from cryo-microscopy to electron beam lithography and can be configured for low-vacuum operation.