MALVERN, UK - Experts from Malvern Instruments are presenting a one-day course, entitled “Fundamentals of Particle Size Analysis with an Emphasis on Light Scattering Techniques,” at Pittcon 2013, taking place March 17-21 in Philadelphia. Dr. Alan Rawle, Applications Manager, and Dr. Ulf Nobbmann, GPC/SEC Product Manager – Americas, will deliver the course on March 19 at 8.30 a.m. To register, visit http://bit.ly/MALFPSA.
The short course will introduce the basics of particle size analysis to those new to the field. The emphasis will be on the essentials of laser diffraction and dynamic light scattering (DLS), but other techniques, such as sieving, sedimentation and electrozone counting, will also be covered. A question and answer session will conclude the day and allow attendees to discuss their queries with the presenters, including any issues with switching from one particle sizing technique to another.
The course is appropriate for comparative newcomers to particle size analysis and those with more experience that require further background. Laboratory personnel, scientists and graduate students are all likely to benefit from the content and the opportunity to interact with leading experts in the field.
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