X-Rite introduced a new imaging benchtop spectrophotometer designed for color measurement of small, multi-colored, and reflective parts. The system measures spots as small as 2 mm and includes on-screen targeting and virtual apertures ranging from 2–12 mm for improved accuracy. It also captures and stores images for traceability and extracts multiple colors from a single sample. The device supports SPIN/SPEX capability and brilliance measurement, which is important for metallic and high-gloss materials. Applications include luxury goods, consumer electronics, and molded components. The unit integrates with Color iQC software for a complete digital workflow.

Learn more: https://www.xrite.com/categories/benchtop-spectrophotometers/cif3200