ISO Revises Standard for Particle-Size Analysis
January 24, 2010
MALVERN, UK – The International Organization for Standardization (ISO) has released ISO13320:2009, a newly revised standard for laser-diffraction particle-size analysis. Malvern Instruments has welcomed the release.
Building on a knowledge base that has advanced significantly over the preceding decade, ISO13320:2009 is an essential resource for instrument manufacturers and users alike. By emphasizing applications and the need for well-defined procedures, it also clearly points the way for future developments.
Commenting on the publication of the new standard, Paul Kippax, Malvern’s Product Manager for Diffraction Products said, “Malvern has been happy to contribute expertise to shape this valuable document and is especially pleased that it includes much-improved advice on method development and optical model selection. This reflects a marked growth in application knowledge in recent years. There is now substantial guidance to enable users to get the most from an investment in a laser-diffraction analyzer. Looking to the future, the challenge for manufacturers is to reduce the burden of method development, making it easier for all users to fully exploit this knowledge base.”
Malvern’s Masterclass series of on-demand webinars covers the majority of topics raised in the new standard and provides a starting point for those wishing to adopt best practices that are in line with the guidance in ISO13320:2009.
“Setting New Standards for Laser Diffraction Particle-Size Analysis,” an article by Alan Rawle and Paul Kippax of Malvern Instruments, examines each aspect of the measurement process for the revised ISO13320:2009 standard. Visit www.malvern.com/common/downloads/campaign/MRK1399-01.pdf to read the complete article.