HiSpeX is an X-ray fluorescence coating thickness and composition measurement tool designed to measure metal film thickness and compositions along with the determination of elemental composition of solids. It utilizes an electrically cooled silicon pin-diode detector coupled with digital signal pulse processing. The device is suitable for demanding coating applications where films below 1,000 angstroms (4 µin.) are employed and/or binary and ternary alloy stacks are required and where complex alloy coatings and/or base materials need to be determined. Features include the ability to measure extremely thin coatings and complex alloys. Device is network compatible and can be programmed for automated measurements with point and shoot graphic assisted motorized programmable stage.
Matrix Metrologies Inc.