Cianflone Scientific Instruments Corp.: The new WDXRF Portaspec X Series benchtop X-ray spectrograph is capable of performing multi-elemental analysis in the range of Ti to U and can be used to measure coating weights of both chrome and titanium pretreatments. The system has an adjustable goniometer that allows the user to analyze up to six elements, preset sequentially one at a time. A two-position sample holder is an integral part of the instrument and is configured for measuring liquids, powders, solids and thin films. Samples are changed at the open end of the holder, allowing one sample to be analyzed while another is being loaded. The instrument comes with a built-in computer and preinstalled software for computer-controlled operation.
For more information, call 800.569.9400 or 412.787.3600 or visit
EQUIPMENT: Benchtop X-Ray Spectrograph - Posted 5/30/07
May 30, 2007