CHEVY CHASE, MD - RadTech International North America's recent "e|5 2004" conference and exhibition drew nearly 2,600 attendees and featured 138 exhibitors and more than 150 technical-program presentations, making the event the largest ever for conference and exhibition participation, the organization said.

Application sessions at the event, in Charlotte, NC, included UV Ink Jet, Graphic Arts, Adhesives, Wood, Plastics, Automotive and Automotive Refinish.

The conference's "Best Paper" award went to Lijing Gou & Alec Scranton of the University of Iowa. Todd Roper of the University of Southern Mississippi won the best student paper prize.

Also during the conference, RadTech and its UV Measurement Focus Group released a "Guide to UV Measurement," a CD reference that addresses UV technology, radiometry and measurement for industrial UV-curing applications. The CD, under development for the past year, follows the "UV Glossary" CD released by the UV Measurement Focus Group in 2003.

Details on CD content and ordering information are available online at