JEOL USA and The College of Microscopy Increase Collaboration
CHICAGO - JEOL USA, a supplier of electron microscopes for research and industrial problem solving, and the College of Microscopy, the education division of The McCrone Group, have announced an increased partnership and joint commitment to improving the study of microscopy.
JEOL USA will provide a new JSM-6610LV low vacuum high-performance scanning electron microscope (SEM) to the College of Microscopy for use in basic and advanced training in electron microscopy. Additionally, a JEOL staff scientist will teach existing SEM courses at the College of Microscopy, help develop specialized classes specifically utilizing the JSM-6610LV and work with McCrone scientists to develop new applications for six JEOL instruments already onsite.
The McCrone Group’s analytical division, McCrone Associates, has used JEOL instruments to solve materials characterization and identification problems for government and industrial customers worldwide in industries ranging from forensics to pharmaceuticals to packaging for over 35 years. Today’s generation of electron microscopes deliver extremely high resolution for nanotechnology research and unprecedented quality for imaging fine surface details, analyzing biological and fabricated samples at the atomic level, and seeing microscopic details as they really are, magnified hundreds of thousands of times.
McCrone Associates currently houses six JEOL instruments in its laboratories: three scanning electron microscopes, two electron microprobes and one transmission electron microscope. The JSM-6610LV is the first JEOL instrument at McCrone devoted specifically to educating students at the College of Microscopy; it provides for fast characterization and high resolution imaging of a wide variety of samples.
The College of Microscopy provides highly specialized training and continuing education for scientists, crime lab personnel, researchers, educators and technicians from around the world. Now, the college will incorporate its JEOL JSM-6610LV into existing scanning electron courses, offering students from a wide variety of fields state-of-the-art instrumentation to improve their understanding of particle analysis.
This fall, the College of Microscopy is also partnering with Concordia University, Chicago to offer one of the nation’s first degree programs in Applied Microscopy. After three years of traditional study, students will complete a one-year practicum at the College’s 40,000-square-foot learning center in Westmont, IL, where they will also have access to the JSM-6610LV provided by JEOL.
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