MALVERN, UK - Organizers of the two-day Particle Summit, which takes place near Boston on Oct. 20-21, 2010, have announced two additional speakers for the event.
Joerg Bolze, from analytical X-ray company PANalytical, will present “Nanoparticle size distribution determination by small-angle X-ray scattering on a multi-purpose X-ray diffractometer platform.” He will include a short introduction to the SAXS technique, together with application examples illustrating its potential and limitations for liquid nanoparticle dispersions, nano-powders and nanocomposites.
Alon Vaisman, from Malvern Instruments, will present “Particle sizing - a proven technology for process control.” He will describe how implementing on-line laser diffraction and real-time process control can maximize efficiency and eliminate out-of-spec production.
For a full program and registration information, visit www.particlesummit.org.
Joerg Bolze, from analytical X-ray company PANalytical, will present “Nanoparticle size distribution determination by small-angle X-ray scattering on a multi-purpose X-ray diffractometer platform.” He will include a short introduction to the SAXS technique, together with application examples illustrating its potential and limitations for liquid nanoparticle dispersions, nano-powders and nanocomposites.
Alon Vaisman, from Malvern Instruments, will present “Particle sizing - a proven technology for process control.” He will describe how implementing on-line laser diffraction and real-time process control can maximize efficiency and eliminate out-of-spec production.
For a full program and registration information, visit www.particlesummit.org.
Report Abusive Comment