MALVERN, UK – Registration is now open for the inaugural Particle Summit, a new event that provides a forum for users of particle-characterization technology and equipment to learn more and to connect with one another.

Sponsored by Malvern Instruments, the Particle Summit takes place on Oct. 20-21, 2010, at the Charles Hotel, Cambridge, MA. It is intended for anyone wishing to expand their knowledge in the fields of particle and molecular characterization and promises an information-rich and practical program. In addition to two days of presentations and case studies given by a host of experts, an optional preconference workshop on Oct. 19 will cover the basic principles of particle characterization.

The 15 speakers for the summit are drawn from industry and academia, and also include specialists from Malvern. They include: James Adair, Pennsylvania State University; Danny Chou, Genzyme; Bill Kopesky, Particle Technology Labs (PTL); Martin Muschol, University of South Florida; Kevin Powers, Particle Engineering Research Center, University of Florida; Paul Sojka, Purdue University; and Larry Weiss, Cleanwell Co. Neil Lewis, Chief Technology Officer at Malvern Instruments, will give the keynote address on “New Particle Characterization Challenges - Physico-Chemical Measurement Needs for Emerging Industries.”

The preconference workshop, which will provide instruction in the basic principles of particle characterization, is recommended for anyone relatively new to the field or who would like a refresher on the core topics being addressed in the conference.

For a full program, registration information and details of early-bird rates, visit