Malvern Instruments Sponsors Short Courses at Pittcon 2011
MALVERN, UK - Malvern Instruments will run two one-day short courses as part of the established program at Pittcon 2011, held March 13-18, 2011, in Atlanta, GA. The first of these, on March 14, covers the fundamentals of particle sizing with an emphasis on light-scattering techniques. The second, which takes place March 16, examines molecular and particle characterization by dynamic light scattering and zeta potential. Registration is open for both via the Pittcon Web site, www.pittcon.org.
“Fundamentals of Particle Size Analysis with an Emphasis on Light Scattering Techniques” will bring newcomers to the particle sizing field up to speed on the basics of particle size analysis. The main techniques (sieves, sedimentation and electrozone sensing) will be covered with an emphasis on dynamic light scattering and laser diffraction.
“Molecular and Particle Characterization by Dynamic Light Scattering and Zeta Potential” will discuss, review and provide useful tips for dynamic light scattering (DLS, PCS, QELS), molecular weight and electrophoretic light scattering (zeta potential) measurements.
“Fundamentals of Particle Size Analysis with an Emphasis on Light Scattering Techniques” will bring newcomers to the particle sizing field up to speed on the basics of particle size analysis. The main techniques (sieves, sedimentation and electrozone sensing) will be covered with an emphasis on dynamic light scattering and laser diffraction.
“Molecular and Particle Characterization by Dynamic Light Scattering and Zeta Potential” will discuss, review and provide useful tips for dynamic light scattering (DLS, PCS, QELS), molecular weight and electrophoretic light scattering (zeta potential) measurements.
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