SCHAUMBURG, IL – K ALPHA has acquired Bowman Analytics, its long-time partner for X-ray fluorescence (XRF) instrumentation for coating thickness measurement, elemental analysis, and solution analysis. Business operations between the two companies will merge and there will be one unified management team leading the combined offering. Bowman Analytics will maintain its facility in Pompano Beach, FL.

Key members of both Bowman Analytics and K ALPHA have worked together before, when they were at Coating Measurement Instruments.

K ALPHA has been selling and servicing the XRF equipment that Bowman Analytics has developed and manufactured since 2014. With this merger, the two companies’ leadership team will be able to collaborate even more seamlessly and deliver better instrumentation and support to their customers.

Bowman Analytics manufactures XRF instrumentation for accurate measurement and analysis of coating thickness.

K ALPHA provides sales, service and application support for handheld and bench-top coating thickness testers, material elemental analyzers, metal hardness testers, and material phase ID products that utilize XRF, eddy current, magnetic induction, micro-resistance, LIBS (laser-induced breakdown spectroscopy) or Raman technology.